Saksham Jain

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I am a Ph.D. student in the Department of Statistics at the University of Washington, where I am advised by Profs. Alex Luedtke and Ting Ye. I also work closely with Prof. Masaaki Imaizumi at the University of Tokyo. Before coming to UW, I completed my M.S. in electrical and computer engineering at Duke University, advised by Profs. Cynthia Rudin, Alex Volfovsky, and Sudeepa Roy. Prior to that, I received my B.E. in automation engineering from the University of Delhi, India, where I was advised by Prof. Umang Soni.

My research interests lie in causal inference, nonparametric statistics, and deep learning. My recent work develops doubly robust estimation and inference for conditional distributional treatment effects. I am currently working on statistical applications of recent state evolution results for gradient descent in finite-width multi-layer neural networks.

news

Jun 29, 2026 I am a Visiting Scholar at the Harvard Medical School for Summer 2026
Jun 16, 2026 I won the Runner Up to the Outstanding Written Student Paper Award at WNAR 2026!
May 20, 2026 I won the Student Research Award at NESS 2026!
May 12, 2026 I will present a poster on conditional distributional treatment effects at ACIC on May 12, 2026
Mar 17, 2026 New preprint (work with Alex) out on arXiv!

selected publications

  1. scodite_intro.png
    Conditional Distributional Treatment Effects: Doubly Robust Estimation and Testing
    Saksham Jain, and Alex Luedtke
    Preprint (Submitted), 2026
  2. AAAI-24
    Evaluating Pre-Trial Programs Using Interpretable Machine Learning Matching Algorithms for Causal Inference
    Saksham Jain*, Travis Seale-Carlisle* , Courtney Lee , and 6 more authors
    AAAI-24, 2024
  3. NeurIPS-22 WS
    Closing the domain gap: blended synthetic imagery for climate object detection
    Caleb Kornfein , Saksham Jain*, Frank Willard* , and 5 more authors
    Workshop: NeurIPS 2022 Workshop on Tackling Climate Change with Machine Learning; Journal: Environmental Data Science, 2023
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    Synthetic data augmentation for surface defect detection and classification using deep learning
    Saksham Jain, Gautam Seth , Arpit Paruthi , and 2 more authors
    Journal of Intelligent Manufacturing, 2022
  5. IEEE TPAMI
    Mining data impressions from deep models as substitute for the unavailable training data
    Gaurav Kumar Nayak , Konda Reddy Mopuri , Saksham Jain, and 1 more author
    IEEE Transactions on Pattern Analysis and Machine Intelligence, 2021